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| author | Carl-Daniel Hailfinger <c-d.hailfinger.devel.2006@gmx.net> | 2008-11-28 23:45:27 +0000 |
|---|---|---|
| committer | Carl-Daniel Hailfinger <c-d.hailfinger.devel.2006@gmx.net> | 2008-11-28 23:45:27 +0000 |
| commit | 6a0a25cada03fc6a36a065db18b29ca832288aa6 (patch) | |
| tree | 43c7d76d6be2b101cc4d8c7c6040dfc977cb6701 /flash.h | |
| parent | a3f04be761d45aed2f6113eb2a6d08679370f546 (diff) | |
| download | ast2050-flashrom-6a0a25cada03fc6a36a065db18b29ca832288aa6.zip ast2050-flashrom-6a0a25cada03fc6a36a065db18b29ca832288aa6.tar.gz | |
Do not indicate known-bad functions as untested
If a chip has any TEST_BAD_* flag set, we don't even list the
unsupported functions, giving the user the impression that the
unsupported functions are tested.
Corresponding to flashrom svn r352 and coreboot v2 svn r3780.
Signed-off-by: Carl-Daniel Hailfinger <c-d.hailfinger.devel.2006@gmx.net>
Acked-by: Peter Stuge <peter@stuge.se>
Diffstat (limited to 'flash.h')
| -rw-r--r-- | flash.h | 3 |
1 files changed, 2 insertions, 1 deletions
@@ -95,6 +95,7 @@ struct flashchip { #define TEST_BAD_READ (1<<5) #define TEST_BAD_ERASE (1<<6) #define TEST_BAD_WRITE (1<<7) +#define TEST_BAD_PREW (TEST_BAD_PROBE|TEST_BAD_READ|TEST_BAD_ERASE|TEST_BAD_WRITE) #define TEST_BAD_MASK 0xf0 extern struct flashchip flashchips[]; @@ -106,7 +107,7 @@ extern struct flashchip flashchips[]; * * All LPC/FWH parts (parallel flash) have 8-bit device IDs if there is no * continuation code. - * All SPI parts have 16-bit device IDs. + * SPI parts have 16-bit device IDs if they support RDID. */ #define GENERIC_DEVICE_ID 0xffff /* Only match the vendor ID */ |
