From 6943f8af7d6583be57d67bba8b2644371f6a10ca Mon Sep 17 00:00:00 2001 From: David Woodhouse Date: Sat, 13 May 2006 16:14:26 +0100 Subject: [MTD NAND] Reduce paranoia level when scanning for bad blocks on virgin chips We were scanning for 0xFF through the entire chip -- which takes a while when it's a 512MiB device as I have on my current toy. The specs only say we need to check certain bytes -- so do only that. Signed-off-by: David Woodhouse --- drivers/mtd/nand/nand_bbt.c | 4 ++-- 1 file changed, 2 insertions(+), 2 deletions(-) (limited to 'drivers/mtd') diff --git a/drivers/mtd/nand/nand_bbt.c b/drivers/mtd/nand/nand_bbt.c index 32f063b..ccc48a4 100644 --- a/drivers/mtd/nand/nand_bbt.c +++ b/drivers/mtd/nand/nand_bbt.c @@ -981,14 +981,14 @@ static struct nand_bbt_descr largepage_memorybased = { }; static struct nand_bbt_descr smallpage_flashbased = { - .options = NAND_BBT_SCANEMPTY | NAND_BBT_SCANALLPAGES, + .options = NAND_BBT_SCAN2NDPAGE, .offs = 5, .len = 1, .pattern = scan_ff_pattern }; static struct nand_bbt_descr largepage_flashbased = { - .options = NAND_BBT_SCANEMPTY | NAND_BBT_SCANALLPAGES, + .options = NAND_BBT_SCAN2NDPAGE, .offs = 0, .len = 2, .pattern = scan_ff_pattern -- cgit v1.1