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* [MTD] [TESTS] Fix some size_t printk format warningsDavid Woodhouse2009-01-052-4/+4
| | | | Signed-off-by: David Woodhouse <David.Woodhouse@intel.com>
* MTD: add MTD tests to compilationArtem Bityutskiy2008-12-101-0/+7
| | | | | | Add MTD tests to Kconfig and Makefiles. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
* MTD: tests: add mtd_torturetestArtem Bityutskiy2008-12-101-0/+530
| | | | | | | This test is designed to work for very long time and it tries to wear few eraseblocks. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
* MTD: tests: add mtd_subpagetestArtem Bityutskiy2008-12-081-0/+525
| | | | | | This tests makes sure sub-pages on NAND MTD device work fine. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
* MTD: tests: add mtd_stresstestArtem Bityutskiy2008-12-081-0/+330
| | | | | | This test just performs random operations on random eraseblocks. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
* MTD: tests: add mtd_speedtestArtem Bityutskiy2008-12-081-0/+502
| | | | | | This test examines I/O speed of the flash device. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
* MTD: tests: add mtd_readtestArtem Bityutskiy2008-12-081-0/+253
| | | | | | A simple tests which reads whole MTD device one page at a time. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
* MTD: tests: add mtd_pagetestArtem Bityutskiy2008-12-081-0/+632
| | | | | | This test checks that NAND pages read/write work fine. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
* MTD: tests: add mtd_oobtestArtem Bityutskiy2008-12-081-0/+742
This test checks that OOB of a NAND MTD device works fine. Signed-off-by: Artem Bityutskiy <Artem.Bityutskiy@nokia.com>
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