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| author | Sylwester Nawrocki <s.nawrocki@samsung.com> | 2012-04-30 04:34:10 -0300 |
|---|---|---|
| committer | Mauro Carvalho Chehab <mchehab@redhat.com> | 2012-05-14 14:24:24 -0300 |
| commit | cf072139c7952e267a2eff334f224a62c949ee96 (patch) | |
| tree | 9e793840d43b70152f506a43fe7e06ee97e7f524 /security/smack | |
| parent | 7f84ad8bdb63a8bfcbb83755e487e06be5db54cf (diff) | |
| download | op-kernel-dev-cf072139c7952e267a2eff334f224a62c949ee96.zip op-kernel-dev-cf072139c7952e267a2eff334f224a62c949ee96.tar.gz | |
[media] V4L: Add camera exposure metering control
The V4L2_CID_EXPOSURE_METERING control allows to determine
a method used by the camera for measuring the amount of light
available for automatic exposure.
Signed-off-by: Sylwester Nawrocki <s.nawrocki@samsung.com>
Signed-off-by: Kyungmin Park <kyungmin.park@samsung.com>
Signed-off-by: Mauro Carvalho Chehab <mchehab@redhat.com>
Diffstat (limited to 'security/smack')
0 files changed, 0 insertions, 0 deletions
