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| author | Jingoo Han <jg1.han@samsung.com> | 2011-05-09 15:28:39 +0900 |
|---|---|---|
| committer | Greg Kroah-Hartman <gregkh@suse.de> | 2011-05-10 14:14:59 -0700 |
| commit | 27362d467b3d9955f6ae1737002dac8c0f99fdc7 (patch) | |
| tree | e865810add690d926f2e99baf946f6903c93449a /drivers/usb/misc/usbtest.c | |
| parent | c851e83f00f6d343ff7e7405f6f50eb3ba288a2c (diff) | |
| download | op-kernel-dev-27362d467b3d9955f6ae1737002dac8c0f99fdc7.zip op-kernel-dev-27362d467b3d9955f6ae1737002dac8c0f99fdc7.tar.gz | |
USB: ehci-s5p : use __devinit and __devexit macros for probe and remove
The __devinit and __devexit macros were added to probe and remove
functions. The macros move the probe and remove functions to the
devinit and devexit sections
Signed-off-by: Jingoo Han <jg1.han@samsung.com>
Signed-off-by: Greg Kroah-Hartman <gregkh@suse.de>
Diffstat (limited to 'drivers/usb/misc/usbtest.c')
0 files changed, 0 insertions, 0 deletions
