diff options
author | Grant Likely <grant.likely@linaro.org> | 2015-03-27 20:30:04 -0700 |
---|---|---|
committer | Grant Likely <grant.likely@linaro.org> | 2015-03-29 08:56:20 +0100 |
commit | 37791b6fbe7ab772020e714d34515f144fa981a0 (patch) | |
tree | 32b4e3426cd3112e705c63e8ea02f93c101516a3 /drivers/of | |
parent | 716e1d493a8717251158c708b2f161017bdcb3f9 (diff) | |
download | op-kernel-dev-37791b6fbe7ab772020e714d34515f144fa981a0.zip op-kernel-dev-37791b6fbe7ab772020e714d34515f144fa981a0.tar.gz |
of/unittest: Fix of_platform_depopulate test case
The previous commit, "of/unittest: early return from test skips tests"
exposed broken tests for the of_platform_unpopulate() function. The
problem was the populate and depopulate calls were not symmetrical like
they were intended to be, and unpopulate depends on the parent device to
have it's of_node pointer pointing to the parent device node. Fix these
bugs so that the test case works correctly.
In the process, the test_bus used as a container for the test devices
has been changed from a statically allocated struct device (which is
bad) to a properly allocated device with a .release() method (which is
good). This stops the test code from being a bad example of abusing the
device model.
Signed-off-by: Grant Likely <grant.likely@linaro.org>
Cc: Frank Rowand <frank.rowand@sonymobile.com>
Cc: Pantelis Antoniou <pantelis.antoniou@konsulko.com>
Cc: Pawel Moll <pawel.moll@arm.com>
Diffstat (limited to 'drivers/of')
-rw-r--r-- | drivers/of/unittest.c | 16 |
1 files changed, 9 insertions, 7 deletions
diff --git a/drivers/of/unittest.c b/drivers/of/unittest.c index 3b15577..a4f90c2 100644 --- a/drivers/of/unittest.c +++ b/drivers/of/unittest.c @@ -751,14 +751,14 @@ static void __init of_selftest_match_node(void) } } -struct device test_bus = { - .init_name = "unittest-bus", +static const struct platform_device_info test_bus_info = { + .name = "unittest-bus", }; static void __init of_selftest_platform_populate(void) { int irq, rc; struct device_node *np, *child, *grandchild; - struct platform_device *pdev; + struct platform_device *pdev, *test_bus; const struct of_device_id match[] = { { .compatible = "test-device", }, {} @@ -787,20 +787,22 @@ static void __init of_selftest_platform_populate(void) if (!np) return; - rc = device_register(&test_bus); + test_bus = platform_device_register_full(&test_bus_info); + rc = PTR_ERR_OR_ZERO(test_bus); selftest(!rc, "testbus registration failed; rc=%i\n", rc); if (rc) return; + test_bus->dev.of_node = np; + of_platform_populate(np, match, NULL, &test_bus->dev); for_each_child_of_node(np, child) { - of_platform_populate(child, match, NULL, &test_bus); for_each_child_of_node(child, grandchild) selftest(of_find_device_by_node(grandchild), "Could not create device for node '%s'\n", grandchild->name); } - of_platform_depopulate(&test_bus); + of_platform_depopulate(&test_bus->dev); for_each_child_of_node(np, child) { for_each_child_of_node(child, grandchild) selftest(!of_find_device_by_node(grandchild), @@ -808,7 +810,7 @@ static void __init of_selftest_platform_populate(void) grandchild->name); } - device_unregister(&test_bus); + platform_device_unregister(test_bus); of_node_put(np); } |