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author | David Woodhouse <dwmw2@infradead.org> | 2006-05-13 16:14:26 +0100 |
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committer | David Woodhouse <dwmw2@infradead.org> | 2006-05-13 16:14:26 +0100 |
commit | 6943f8af7d6583be57d67bba8b2644371f6a10ca (patch) | |
tree | b6c3842b6616b4878677c9bded3a12a6e99dda3d /drivers/mtd/nand/rtc_from4.c | |
parent | 9d75414b4fa7390975ef0e2b56ff40425657fe52 (diff) | |
download | op-kernel-dev-6943f8af7d6583be57d67bba8b2644371f6a10ca.zip op-kernel-dev-6943f8af7d6583be57d67bba8b2644371f6a10ca.tar.gz |
[MTD NAND] Reduce paranoia level when scanning for bad blocks on virgin chips
We were scanning for 0xFF through the entire chip -- which takes a while
when it's a 512MiB device as I have on my current toy. The specs only say
we need to check certain bytes -- so do only that.
Signed-off-by: David Woodhouse <dwmw2@infradead.org>
Diffstat (limited to 'drivers/mtd/nand/rtc_from4.c')
0 files changed, 0 insertions, 0 deletions