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authorLinus Torvalds <torvalds@linux-foundation.org>2015-04-22 12:00:44 -0700
committerLinus Torvalds <torvalds@linux-foundation.org>2015-04-22 12:00:44 -0700
commita62d016cece2fce1d5e4eedf36b17f03a7a5c78e (patch)
treeac37b4835be5f4fe0e04611fdb40c85abb98ec78 /README
parent7c034dfd58bbc056280262887acf5b7a98944d0a (diff)
parent3e550d2396d9deef77328237ed992e19dcfefca5 (diff)
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Merge tag 'for-linus-20150422' of git://git.infradead.org/linux-mtd
Pull MTD updates from Brian Norris: "Common MTD: - Add Kconfig option for keeping both the 'master' and 'partition' MTDs registered as devices. This would really make a better default if we could do it over, as it allows a lot more flexibility in (1) determining the flash topology of the system from user-space and (2) adding temporary partitions at runtime (ioctl(BLKPG)). Unfortunately, this would possibly cause user-space breakage, as it will cause renumbering of the /dev/mtdX devices. We'll see if we can change this in the future, as there have already been a few people looking for this feature, and I know others have just been working around our current limitations instead of fixing them this way. - Along with the previous change, add some additional information to sysfs, so user-space can read the offset of each partition within its master device SPI NOR: - add new device tree compatible binding to represent the mostly-compatible class of SPI NOR flash which can be detected by their extended JEDEC ID bytes, cutting down the duplication of our ID tables - misc. new IDs Various other miscellaneous fixes and changes" * tag 'for-linus-20150422' of git://git.infradead.org/linux-mtd: (53 commits) mtd: spi-nor: Add support for Macronix mx25u6435f serial flash mtd: spi-nor: Add support for Winbond w25q64dw serial flash mtd: spi-nor: add support for the Winbond W25X05 flash mtd: spi-nor: support en25s64 device mtd: m25p80: bind to "nor-jedec" ID, for auto-detection Documentation: devicetree: m25p80: add "nor-jedec" binding mtd: Make MTD tests cancelable mtd: mtd_oobtest: Fix bitflip_limit usage in test case 3 mtd: docg3: remove invalid __exit annotations mtd: fsl_ifc_nand: use msecs_to_jiffies for time conversion mtd: atmel_nand: don't map the ROM table if no pmecc table offset in DT mtd: atmel_nand: add a definition for the oob reserved bytes mtd: part: Remove partition overlap checks mtd: part: Add sysfs variable for offset of partition mtd: part: Create the master device node when partitioned mtd: ts5500_flash: Fix typo in MODULE_DESCRIPTION in ts5500_flash.c mtd: denali: Disable sub-page writes in Denali NAND driver mtd: pxa3xx_nand: cleanup wait_for_completion handling mtd: nand: gpmi: Check for scan_bbt() error mtd: nand: gpmi: fixup return type of wait_for_completion_timeout ...
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