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/*
* This file is part of the flashrom project.
*
* Copyright (C) 2000 Silicon Integrated System Corporation
* Copyright (C) 2000 Ronald G. Minnich <rminnich@gmail.com>
* Copyright (C) 2005-2009 coresystems GmbH
* Copyright (C) 2006-2009 Carl-Daniel Hailfinger
*
* This program is free software; you can redistribute it and/or modify
* it under the terms of the GNU General Public License as published by
* the Free Software Foundation; either version 2 of the License, or
* (at your option) any later version.
*
* This program is distributed in the hope that it will be useful,
* but WITHOUT ANY WARRANTY; without even the implied warranty of
* MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the
* GNU General Public License for more details.
*
* You should have received a copy of the GNU General Public License
* along with this program; if not, write to the Free Software
* Foundation, Inc., 51 Franklin St, Fifth Floor, Boston, MA 02110-1301 USA
*/
#ifndef __FLASH_H__
#define __FLASH_H__ 1
#include <stdint.h>
#include <stddef.h>
#ifdef _WIN32
#include <windows.h>
#undef min
#undef max
#endif
#define ERROR_PTR ((void*)-1)
/* Error codes */
#define ERROR_OOM -100
#define TIMEOUT_ERROR -101
typedef unsigned long chipaddr;
int register_shutdown(int (*function) (void *data), void *data);
void *programmer_map_flash_region(const char *descr, unsigned long phys_addr,
size_t len);
void programmer_unmap_flash_region(void *virt_addr, size_t len);
void programmer_delay(int usecs);
#define ARRAY_SIZE(a) (sizeof(a) / sizeof((a)[0]))
enum chipbustype {
BUS_NONE = 0,
BUS_PARALLEL = 1 << 0,
BUS_LPC = 1 << 1,
BUS_FWH = 1 << 2,
BUS_SPI = 1 << 3,
BUS_PROG = 1 << 4,
BUS_NONSPI = BUS_PARALLEL | BUS_LPC | BUS_FWH,
};
/*
* How many different contiguous runs of erase blocks with one size each do
* we have for a given erase function?
*/
#define NUM_ERASEREGIONS 5
/*
* How many different erase functions do we have per chip?
* Atmel AT25FS010 has 6 different functions.
*/
#define NUM_ERASEFUNCTIONS 6
#define FEATURE_REGISTERMAP (1 << 0)
#define FEATURE_BYTEWRITES (1 << 1)
#define FEATURE_LONG_RESET (0 << 4)
#define FEATURE_SHORT_RESET (1 << 4)
#define FEATURE_EITHER_RESET FEATURE_LONG_RESET
#define FEATURE_RESET_MASK (FEATURE_LONG_RESET | FEATURE_SHORT_RESET)
#define FEATURE_ADDR_FULL (0 << 2)
#define FEATURE_ADDR_MASK (3 << 2)
#define FEATURE_ADDR_2AA (1 << 2)
#define FEATURE_ADDR_AAA (2 << 2)
#define FEATURE_ADDR_SHIFTED (1 << 5)
#define FEATURE_WRSR_EWSR (1 << 6)
#define FEATURE_WRSR_WREN (1 << 7)
#define FEATURE_OTP (1 << 8)
#define FEATURE_WRSR_EITHER (FEATURE_WRSR_EWSR | FEATURE_WRSR_WREN)
struct flashctx;
struct flashchip {
const char *vendor;
const char *name;
enum chipbustype bustype;
/*
* With 32bit manufacture_id and model_id we can cover IDs up to
* (including) the 4th bank of JEDEC JEP106W Standard Manufacturer's
* Identification code.
*/
uint32_t manufacture_id;
uint32_t model_id;
/* Total chip size in kilobytes */
unsigned int total_size;
/* Chip page size in bytes */
unsigned int page_size;
int feature_bits;
/*
* Indicate if flashrom has been tested with this flash chip and if
* everything worked correctly.
*/
uint32_t tested;
int (*probe) (struct flashctx *flash);
/* Delay after "enter/exit ID mode" commands in microseconds.
* NB: negative values have special meanings, see TIMING_* below.
*/
signed int probe_timing;
/*
* Erase blocks and associated erase function. Any chip erase function
* is stored as chip-sized virtual block together with said function.
* The first one that fits will be chosen. There is currently no way to
* influence that behaviour. For testing just comment out the other
* elements or set the function pointer to NULL.
*/
struct block_eraser {
struct eraseblock{
unsigned int size; /* Eraseblock size in bytes */
unsigned int count; /* Number of contiguous blocks with that size */
} eraseblocks[NUM_ERASEREGIONS];
/* a block_erase function should try to erase one block of size
* 'blocklen' at address 'blockaddr' and return 0 on success. */
int (*block_erase) (struct flashctx *flash, unsigned int blockaddr, unsigned int blocklen);
} block_erasers[NUM_ERASEFUNCTIONS];
int (*printlock) (struct flashctx *flash);
int (*unlock) (struct flashctx *flash);
int (*write) (struct flashctx *flash, uint8_t *buf, unsigned int start, unsigned int len);
int (*read) (struct flashctx *flash, uint8_t *buf, unsigned int start, unsigned int len);
struct voltage {
uint16_t min;
uint16_t max;
} voltage;
};
/* struct flashctx must always contain struct flashchip at the beginning. */
struct flashctx {
const char *vendor;
const char *name;
enum chipbustype bustype;
uint32_t manufacture_id;
uint32_t model_id;
int total_size;
int page_size;
int feature_bits;
uint32_t tested;
int (*probe) (struct flashctx *flash);
int probe_timing;
struct block_eraser block_erasers[NUM_ERASEFUNCTIONS];
int (*printlock) (struct flashctx *flash);
int (*unlock) (struct flashctx *flash);
int (*write) (struct flashctx *flash, uint8_t *buf, unsigned int start, unsigned int len);
int (*read) (struct flashctx *flash, uint8_t *buf, unsigned int start, unsigned int len);
struct voltage voltage;
/* struct flashchip ends here. */
chipaddr virtual_memory;
/* Some flash devices have an additional register space. */
chipaddr virtual_registers;
struct registered_programmer *pgm;
};
typedef int (erasefunc_t)(struct flashctx *flash, unsigned int addr, unsigned int blocklen);
#define TEST_UNTESTED 0
#define TEST_OK_PROBE (1 << 0)
#define TEST_OK_READ (1 << 1)
#define TEST_OK_ERASE (1 << 2)
#define TEST_OK_WRITE (1 << 3)
#define TEST_OK_PR (TEST_OK_PROBE | TEST_OK_READ)
#define TEST_OK_PRE (TEST_OK_PROBE | TEST_OK_READ | TEST_OK_ERASE)
#define TEST_OK_PRW (TEST_OK_PROBE | TEST_OK_READ | TEST_OK_WRITE)
#define TEST_OK_PREW (TEST_OK_PROBE | TEST_OK_READ | TEST_OK_ERASE | TEST_OK_WRITE)
#define TEST_OK_MASK 0x0f
#define TEST_BAD_PROBE (1 << 4)
#define TEST_BAD_READ (1 << 5)
#define TEST_BAD_ERASE (1 << 6)
#define TEST_BAD_WRITE (1 << 7)
#define TEST_BAD_PREW (TEST_BAD_PROBE | TEST_BAD_READ | TEST_BAD_ERASE | TEST_BAD_WRITE)
#define TEST_BAD_MASK 0xf0
/* Timing used in probe routines. ZERO is -2 to differentiate between an unset
* field and zero delay.
*
* SPI devices will always have zero delay and ignore this field.
*/
#define TIMING_FIXME -1
/* this is intentionally same value as fixme */
#define TIMING_IGNORED -1
#define TIMING_ZERO -2
extern const struct flashchip flashchips[];
void chip_writeb(const struct flashctx *flash, uint8_t val, chipaddr addr);
void chip_writew(const struct flashctx *flash, uint16_t val, chipaddr addr);
void chip_writel(const struct flashctx *flash, uint32_t val, chipaddr addr);
void chip_writen(const struct flashctx *flash, uint8_t *buf, chipaddr addr, size_t len);
uint8_t chip_readb(const struct flashctx *flash, const chipaddr addr);
uint16_t chip_readw(const struct flashctx *flash, const chipaddr addr);
uint32_t chip_readl(const struct flashctx *flash, const chipaddr addr);
void chip_readn(const struct flashctx *flash, uint8_t *buf, const chipaddr addr, size_t len);
/* print.c */
char *flashbuses_to_text(enum chipbustype bustype);
void print_supported(void);
void print_supported_wiki(void);
/* flashrom.c */
enum write_granularity {
write_gran_1bit,
write_gran_1byte,
write_gran_256bytes,
};
extern int verbose_screen;
extern int verbose_logfile;
extern const char flashrom_version[];
extern char *chip_to_probe;
void map_flash_registers(struct flashctx *flash);
int read_memmapped(struct flashctx *flash, uint8_t *buf, unsigned int start, unsigned int len);
int erase_flash(struct flashctx *flash);
int probe_flash(struct registered_programmer *pgm, int startchip, struct flashctx *fill_flash, int force);
int read_flash_to_file(struct flashctx *flash, const char *filename);
int min(int a, int b);
int max(int a, int b);
void tolower_string(char *str);
char *extract_param(char **haystack, const char *needle, const char *delim);
int verify_range(struct flashctx *flash, uint8_t *cmpbuf, unsigned int start, unsigned int len, const char *message);
int need_erase(uint8_t *have, uint8_t *want, unsigned int len, enum write_granularity gran);
char *strcat_realloc(char *dest, const char *src);
void print_version(void);
void print_buildinfo(void);
void print_banner(void);
void list_programmers_linebreak(int startcol, int cols, int paren);
int selfcheck(void);
int doit(struct flashctx *flash, int force, const char *filename, int read_it, int write_it, int erase_it, int verify_it);
int read_buf_from_file(unsigned char *buf, unsigned long size, const char *filename);
int write_buf_to_file(unsigned char *buf, unsigned long size, const char *filename);
enum test_state {
OK = 0,
NT = 1, /* Not tested */
BAD
};
/* Something happened that shouldn't happen, but we can go on. */
#define ERROR_NONFATAL 0x100
/* Something happened that shouldn't happen, we'll abort. */
#define ERROR_FATAL -0xee
#define ERROR_FLASHROM_BUG -200
/* We reached one of the hardcoded limits of flashrom. This can be fixed by
* increasing the limit of a compile-time allocation or by switching to dynamic
* allocation.
* Note: If this warning is triggered, check first for runaway registrations.
*/
#define ERROR_FLASHROM_LIMIT -201
/* cli_output.c */
#ifndef STANDALONE
int open_logfile(const char * const filename);
int close_logfile(void);
void start_logging(void);
#endif
enum msglevel {
MSG_ERROR = 0,
MSG_INFO = 1,
MSG_DEBUG = 2,
MSG_DEBUG2 = 3,
MSG_SPEW = 4,
};
/* Let gcc and clang check for correct printf-style format strings. */
int print(enum msglevel level, const char *fmt, ...) __attribute__((format(printf, 2, 3)));
#define msg_gerr(...) print(MSG_ERROR, __VA_ARGS__) /* general errors */
#define msg_perr(...) print(MSG_ERROR, __VA_ARGS__) /* programmer errors */
#define msg_cerr(...) print(MSG_ERROR, __VA_ARGS__) /* chip errors */
#define msg_ginfo(...) print(MSG_INFO, __VA_ARGS__) /* general info */
#define msg_pinfo(...) print(MSG_INFO, __VA_ARGS__) /* programmer info */
#define msg_cinfo(...) print(MSG_INFO, __VA_ARGS__) /* chip info */
#define msg_gdbg(...) print(MSG_DEBUG, __VA_ARGS__) /* general debug */
#define msg_pdbg(...) print(MSG_DEBUG, __VA_ARGS__) /* programmer debug */
#define msg_cdbg(...) print(MSG_DEBUG, __VA_ARGS__) /* chip debug */
#define msg_gdbg2(...) print(MSG_DEBUG2, __VA_ARGS__) /* general debug2 */
#define msg_pdbg2(...) print(MSG_DEBUG2, __VA_ARGS__) /* programmer debug2 */
#define msg_cdbg2(...) print(MSG_DEBUG2, __VA_ARGS__) /* chip debug2 */
#define msg_gspew(...) print(MSG_SPEW, __VA_ARGS__) /* general debug spew */
#define msg_pspew(...) print(MSG_SPEW, __VA_ARGS__) /* programmer debug spew */
#define msg_cspew(...) print(MSG_SPEW, __VA_ARGS__) /* chip debug spew */
/* layout.c */
int register_include_arg(char *name);
int process_include_args(void);
int read_romlayout(char *name);
int handle_romentries(struct flashctx *flash, uint8_t *oldcontents, uint8_t *newcontents);
/* spi.c */
struct spi_command {
unsigned int writecnt;
unsigned int readcnt;
const unsigned char *writearr;
unsigned char *readarr;
};
int spi_send_command(struct flashctx *flash, unsigned int writecnt, unsigned int readcnt, const unsigned char *writearr, unsigned char *readarr);
int spi_send_multicommand(struct flashctx *flash, struct spi_command *cmds);
uint32_t spi_get_valid_read_addr(struct flashctx *flash);
enum chipbustype get_buses_supported(void);
#endif /* !__FLASH_H__ */
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