diff options
Diffstat (limited to 'flash.h')
| -rw-r--r-- | flash.h | 36 |
1 files changed, 17 insertions, 19 deletions
@@ -92,7 +92,8 @@ struct programmer_entry { int (*init) (void); int (*shutdown) (void); - void * (*map_flash_region) (const char *descr, unsigned long phys_addr, size_t len); + void * (*map_flash_region) (const char *descr, unsigned long phys_addr, + size_t len); void (*unmap_flash_region) (void *virt_addr, size_t len); void (*chip_writeb) (uint8_t val, chipaddr addr); @@ -151,20 +152,20 @@ struct flashchip { #define TEST_UNTESTED 0 -#define TEST_OK_PROBE (1<<0) -#define TEST_OK_READ (1<<1) -#define TEST_OK_ERASE (1<<2) -#define TEST_OK_WRITE (1<<3) -#define TEST_OK_PR (TEST_OK_PROBE|TEST_OK_READ) -#define TEST_OK_PRE (TEST_OK_PROBE|TEST_OK_READ|TEST_OK_ERASE) -#define TEST_OK_PREW (TEST_OK_PROBE|TEST_OK_READ|TEST_OK_ERASE|TEST_OK_WRITE) +#define TEST_OK_PROBE (1 << 0) +#define TEST_OK_READ (1 << 1) +#define TEST_OK_ERASE (1 << 2) +#define TEST_OK_WRITE (1 << 3) +#define TEST_OK_PR (TEST_OK_PROBE | TEST_OK_READ) +#define TEST_OK_PRE (TEST_OK_PROBE | TEST_OK_READ | TEST_OK_ERASE) +#define TEST_OK_PREW (TEST_OK_PROBE | TEST_OK_READ | TEST_OK_ERASE | TEST_OK_WRITE) #define TEST_OK_MASK 0x0f -#define TEST_BAD_PROBE (1<<4) -#define TEST_BAD_READ (1<<5) -#define TEST_BAD_ERASE (1<<6) -#define TEST_BAD_WRITE (1<<7) -#define TEST_BAD_PREW (TEST_BAD_PROBE|TEST_BAD_READ|TEST_BAD_ERASE|TEST_BAD_WRITE) +#define TEST_BAD_PROBE (1 << 4) +#define TEST_BAD_READ (1 << 5) +#define TEST_BAD_ERASE (1 << 6) +#define TEST_BAD_WRITE (1 << 7) +#define TEST_BAD_PREW (TEST_BAD_PROBE | TEST_BAD_READ | TEST_BAD_ERASE | TEST_BAD_WRITE) #define TEST_BAD_MASK 0xf0 extern struct flashchip flashchips[]; @@ -534,7 +535,7 @@ extern const struct board_info boards_bad[]; * byte of device ID is related to log(bitsize). */ #define WINBOND_ID 0xDA /* Winbond */ -#define WINBOND_NEX_ID 0xEF /* Winbond (ex Nexcom) serial flash devices */ +#define WINBOND_NEX_ID 0xEF /* Winbond (ex Nexcom) serial flashes */ #define W_25X10 0x3011 #define W_25X20 0x3012 #define W_25X40 0x3013 @@ -659,8 +660,6 @@ int dummy_spi_command(unsigned int writecnt, unsigned int readcnt, /* nic3com.c */ int nic3com_init(void); int nic3com_shutdown(void); -void *nic3com_map(const char *descr, unsigned long phys_addr, size_t len); -void nic3com_unmap(void *virt_addr, size_t len); void nic3com_chip_writeb(uint8_t val, chipaddr addr); uint8_t nic3com_chip_readb(const chipaddr addr); extern struct pcidev_status nics_3com[]; @@ -668,8 +667,6 @@ extern struct pcidev_status nics_3com[]; /* satasii.c */ int satasii_init(void); int satasii_shutdown(void); -void *satasii_map(const char *descr, unsigned long phys_addr, size_t len); -void satasii_unmap(void *virt_addr, size_t len); void satasii_chip_writeb(uint8_t val, chipaddr addr); uint8_t satasii_chip_readb(const chipaddr addr); extern struct pcidev_status satas_sii[]; @@ -850,7 +847,8 @@ int write_49f002(struct flashchip *flash, uint8_t *buf); /* wbsio_spi.c */ int wbsio_check_for_spi(const char *name); -int wbsio_spi_command(unsigned int writecnt, unsigned int readcnt, const unsigned char *writearr, unsigned char *readarr); +int wbsio_spi_command(unsigned int writecnt, unsigned int readcnt, + const unsigned char *writearr, unsigned char *readarr); int wbsio_spi_read(struct flashchip *flash, uint8_t *buf); int wbsio_spi_write_1(struct flashchip *flash, uint8_t *buf); |
