FIPS 140-2 rng data tester for h/w crypto devices. This driver periodically

monitors the entropy data harvested by crypto drivers to verify it complies
with FIPS 140-2.  If data fails any test then the driver discards it and
commences continuous testing of harvested data until it is deemed ok.
Results are collected in a statistics block and, optionally, reported on
the console.  In normal use the overhead associated with this driver is
not noticeable.

Note that drivers must (currently) be compiled specially to enable use.

Obtained from:	original code by Jason L. Wright

1 files changed, 60 insertions, 0 deletions

diff --git a/sys/dev/rndtest/rndtest.h b/sys/dev/rndtest/rndtest.h
new file mode 100644
index 0000000..93b7eb8
--- /dev/null
+++ b/sys/dev/rndtest/rndtest.h
@@ -0,0 +1,60 @@
+/*	$FreeBSD$	*/
+/*	$OpenBSD$	*/
+
+/*
+ * Copyright (c) 2002 Jason L. Wright (jason@thought.net)
+ * All rights reserved.
+ *
+ * Redistribution and use in source and binary forms, with or without
+ * modification, are permitted provided that the following conditions
+ * are met:
+ * 1. Redistributions of source code must retain the above copyright
+ *    notice, this list of conditions and the following disclaimer.
+ * 2. Redistributions in binary form must reproduce the above copyright
+ *    notice, this list of conditions and the following disclaimer in the
+ *    documentation and/or other materials provided with the distribution.
+ * 3. All advertising materials mentioning features or use of this software
+ *    must display the following acknowledgement:
+ *	This product includes software developed by Jason L. Wright
+ * 4. The name of the author may not be used to endorse or promote products
+ *    derived from this software without specific prior written permission.
+ *
+ * THIS SOFTWARE IS PROVIDED BY THE AUTHOR ``AS IS'' AND ANY EXPRESS OR
+ * IMPLIED WARRANTIES, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED
+ * WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE ARE
+ * DISCLAIMED.  IN NO EVENT SHALL THE AUTHOR BE LIABLE FOR ANY DIRECT,
+ * INDIRECT, INCIDENTAL, SPECIAL, EXEMPLARY, OR CONSEQUENTIAL DAMAGES
+ * (INCLUDING, BUT NOT LIMITED TO, PROCUREMENT OF SUBSTITUTE GOODS OR
+ * SERVICES; LOSS OF USE, DATA, OR PROFITS; OR BUSINESS INTERRUPTION)
+ * HOWEVER CAUSED AND ON ANY THEORY OF LIABILITY, WHETHER IN CONTRACT,
+ * STRICT LIABILITY, OR TORT (INCLUDING NEGLIGENCE OR OTHERWISE) ARISING IN
+ * ANY WAY OUT OF THE USE OF THIS SOFTWARE, EVEN IF ADVISED OF THE
+ * POSSIBILITY OF SUCH DAMAGE.
+ */
+
+
+/* Some of the tests depend on these values */
+#define	RNDTEST_NBYTES	2500
+#define	RNDTEST_NBITS	(8 * RNDTEST_NBYTES)
+
+struct rndtest_state {
+	device_t	rs_parent;	/* associated device */
+	u_int8_t	*rs_end, *rs_begin, *rs_current;
+	struct callout	rs_to;
+	int		rs_collect;	/* collect and test data */
+	int		rs_discard;	/* discard/accept random data */
+	u_int8_t	rs_buf[RNDTEST_NBYTES];
+};
+
+struct rndtest_stats {
+	u_int32_t	rst_discard;	/* number of bytes discarded */
+	u_int32_t	rst_tests;	/* number of test runs */
+	u_int32_t	rst_monobit;	/* monobit test failures */
+	u_int32_t	rst_runs;	/* 0/1 runs failures */
+	u_int32_t	rst_longruns;	/* longruns failures */
+	u_int32_t	rst_chi;	/* chi^2 failures */
+};
+
+extern 	struct rndtest_state *rndtest_attach(device_t dev);
+extern	void rndtest_detach(struct rndtest_state *);
+extern	void rndtest_harvest(struct rndtest_state *arg, void * buf, u_int len);